Yervant Zorian is the Chief Technology Advisor of LogicVision Inc. and Vice President and Chief Scientist of Virage Logic Inc. Previously, he was a Distinguished Member of Technical Staff at Bell Labs, Lucent Technologies, Test and Reliability Center of Excellence. His  activities cover the areas of embedded core, IC and Multi-Chip Module embedded test methodologies. Zorian received an MSc degree from the University of Southern California, and a PhD from McGill University. He is currently the Editor-in-Chief of IEEE Design & Test of Computers. He founded and chairs the IEEE Workshop on Testing Embedded Core-based System-on-Chip; and the IEEE P1500 Embedded Core Test Standardization Working Group. He has provided tutorials and courses at numerous conferences and academic programs (such as ITC, ICCAD, DATE, VTS, ETW, etc). He was granted eight patents in the domain of embedded test and received a number of Best Paper Awards. He is a Fellow of IEEE.