Subhasish Mitra

Stanford University, USA

A Cambrian Explosion in Electronic System Testing is Dead Ahead

Abstract

Today’s test and reliability practices cannot meet the levels of thoroughness demanded by today’s (and future) systems — from (autonomous) cars to the cloud. For example, alarming system-level effects such as Silent Data Corruptions have been recently reported by several hyperscalers. Future architectures, from chiplets to 3D, create even bigger challenges. These create golden opportunities for new “System-Driven” approaches – from extremely thorough testing, deemed impossible today, all the way to cost-effective tolerance and prediction of failures in hardware during system operation.

Biography

Subhasish Mitra holds the William E. Ayer Endowed Chair Professorship in the Departments of Electrical Engineering and Computer Science at Stanford University. He directs the Stanford Robust Systems Group, serves on the leadership team of the Microelectronics Commons AI Hardware Hub funded by the US CHIPS and Science Act, leads the Computation Focus Area of the Stanford SystemX Alliance, and is the Associate Chair (Faculty Affairs) of Stanford Computer Science. His research ranges across Robust Computing, NanoSystems, Electronic Design Automation (EDA), and Neurosciences. Results from his research group have influenced almost every contemporary electronic system and have inspired significant government and research initiatives in multiple countries. Prof. Mitra has also consulted for major technology companies including Cisco, Google, Intel, Merck (EMD Electronics), Samsung, and Xilinx (now AMD).

Prof. Mitra’s honors include the Harry H. Goode Memorial Award (by the IEEE Computer Society for outstanding contributions in the information processing field), the Newton Technical Impact Award in EDA (test-of-time honor by ACM SIGDA and IEEE CEDA), the University Researcher Award (by the Semiconductor Industry Association and Semiconductor Research Corporation to recognize lifetime research contributions), the EDAA Achievement Award (by the European Design and Automation Association, given to individuals who made outstanding contributions to electronic design, automation and testing in their life), the Intel Achievement Award (Intel’s highest honor), and the Distinguished Alumnus Award from the Indian Institute of Technology, Kharagpur.

He and his students have published over 15 award-winning papers across 5 topic areas (technology, circuits, EDA, test, verification) at major venues including the Design Automation Conference, International Electron Devices Meeting, International Solid-State Circuits Conference, International Test Conference, Symposium on VLSI Technology, Symposium on VLSI Circuits, and Formal Methods in Computer-Aided Design. He is a Fellow of the ACM and the IEEE, and a Foreign Member of Academia Europaea.